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The International Patent Classification (IPC) is a hierarchical system in which the whole area of technology is divided into a range of sections, classes, subclasses and groups. It provides for a common classification for patents for invention including published patent applications, utility models and utility certificates.
The Cooperative Patent Classification (CPC), in force from 1 January 2013, has been jointly developed by the EPO and the USPTO.
CPC has replaced the previous European classification system (ECLA) and will replace the United States Patent Classification system (USPC) as the official patent classification scheme of both the EPO and the USPTO. The CPC is substantially based on the ECLA system, which itself was a more specific and detailed version of the International Patent Classification (IPC) system.
Japanese FI/F-terms. Japan Platform for Patent Information (J-PlatPat) is provided by the National Center for Industrial Property Information and Training (INPIT) and and the Japan Patent Office (JPO).
Espacenet is a free service on the internet provided by the European Patent Organisation through the EPO and the national offices of its member states. In addition to the worldwide collection and national collections Espacenet offers EP and WO databases in which full texts are also searchable.
PatentInspiration is a freemium patent search and analysis tool of 69 million patents. PatentInspiration quick guide
PatentInspiration is based on the DOCDB database from the EPO (European Patent Office) which contains bibliographic data from over 90 countries. The database contains also full text (claims & descriptions) of the main searched authorities (WO, EP, US, CA, …). Search instruction Help | More information .
Google Patents covers granted patents and published patent applications from the United States Patent and Trademark Office (USPTO) and the European Patent Office (EPO). Coverage expanded to include documents from China, Germany, Canada and WIPO in 2013. US patent documents date back to 1790, EPO and WIPO to 1978.
An easy-to-use interface for the world's leading chemical information sources, millions of literature and patent references, as well as chemical compounds and reactions containing information of CAS databases, such as the Chemical Abstracts database. Also contains Medline. Only the students and staff of University of Oulu are entitled to use this database. All users need to create a personal account to use SciFinder. You will get instructions for registration from informationservice@oulu.fi. Note: the IP address controls have been lifted until June 7, 2021 for easier access to SciFinder also off campus. SciFinder quick guide | Rights to use | SciFinder Content
You can conduct online searches in patent publications from around the world stored in the database of DEPATIS. Data coverage. http://depatisnet.dpma.de/DepatisNet/depatisnet?window=1&space=main&content=statb&action=statb
Patent resources pages of patent databases, patent families, classification systems, patent offices, blogs, attorney directories etc. in the PIUG wiki.
A range of publications designed to assist users in finding technology using patent information: Patentscope search & clir, Finding technology using patnets, WIPO guide to using patent information.
The database includes information about all US patents (including utility, design, reissue, plant patents and SIR documents) from the first patent issued in 1790 to the most recent patent issue week.
The data included in the patents appear as printed on the patent on the day of issue. Changes to patent documents contained in Certificates of Correction and Re-examinations Certificates are not included in the searchable full-text of the patent databases, but are available as additional full-page images at the end of each patent's linked full-page images.
Some patents and images have been excluded from the database. For more information, see the Patent Full-Text Database Contents at http://patft.uspto.gov/help/contents.htm
Japanese patents since 1976, legal status information since 1990.
Japan Platform for Patent Information (J-PlatPat) is provided by the National Center for Industrial Property Information and Training (INPIT) and the Japan Patent Office (JPO).
This facility makes it possible to check the patent's priority and filing dates, verify the applicant or owner, identify the inventor, establish whether the patent is in force and contact the owner or their representative. In addition, it provides a link to any related Supplementary Protection Certificate (SPC).
